Electrical-overstress protection circuit for an integrated circuit

ABSTRACT

An electrical-overstress (EOS) protection circuit for an electronic device includes series-connected resistors, a mode-control switch, and a bias circuit. The series-connected resistors are electrically coupled between an input and an output, and the mode-control switch is electrically coupled between the output and a ground. The bias circuit is electrically coupled to the input for generating a mode-control signal to control the mode-control switch. The bias circuit generates the mode-control signal in a way such that the mode-control switch is open in a normal mode and closed in an EOS mode.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a divisional of U.S. application Ser. No.12/710,535 (Att. Docket HI8324P) filed on Feb. 23, 2010, which claimsthe benefit of U.S. Provisional Application No. 61/252,618 (Att. DocketHI8324PR) filed on Oct. 16, 2009, the complete subject matter both ofwhich are incorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention generally relates to a protection circuit, andmore particularly to an electrical-overstress (EOS) protection circuitfor an electronic device such as an integrated circuit.

2. Description of Related Art

Electronic devices such as semiconductor integrated circuits (ICs) aretypically designed to operate at specified voltages or voltage ranges.The electronic devices may fail or even be damaged when the inputvoltage exceeds the specified voltages or voltage ranges. Such abnormaland harmful input is commonly known as electrical overstress (EOS).

As the incidence of an EOS, which may take the form of for example anelectrical spike, is usually unavoidable in common electronicapplications, there is a need to provide a protection circuit in theelectronic device to prevent the EOS from driving the electronic deviceto failure or damage.

SUMMARY OF THE INVENTION

In view of the foregoing, it is an object of the embodiment of thepresent invention to provide an electrical-overstress (EOS) protectioncircuit for an electronic device in order to protect the electronicdevice from failure and damage.

According to one embodiment, series-connected resistors are electricallycoupled between an input and an output, and a mode-control switch iselectrically coupled between the output and a ground. A bias circuit iselectrically coupled to the input for generating a mode-control signalto control the mode-control switch. The bias circuit generates themode-control signal in a way such that the mode-control switch is openin a normal mode and closed in an EOS mode.

According to another embodiment, series-connected voltage-controlledresistors are electrically coupled between an input and an output, and amode-control switch is electrically coupled between the output and aground. A bias circuit is electrically coupled to the input forgenerating a mode-control signal to control the mode-control switch andalso generating at least one control signal for controlling at least oneof the voltage-controlled resistors. The bias circuit generates themode-control signal and the control signal in a way such that themode-control switch is open in a normal mode and closed in an EOS mode,and resistance of the voltage-controlled resistor is higher in the EOSmode than in the normal mode.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A shows a schematic of an electrical-overstress (EOS) protectioncircuit for an electronic device according to a first embodiment of thepresent invention;

FIG. 1B shows a schematic of an EOS protection circuit for an electronicdevice according to an embodiment alternative to that shown in FIG. 1A;

FIG. 2A and FIG. 2B show one exemplary implementation and associatedparameters of FIG. 1B in the normal mode and the EOS mode respectively;

FIG. 3A shows a schematic of an EOS protection circuit for an electronicdevice according to a second embodiment of the present invention; and

FIG. 3B shows a schematic of an EOS protection circuit for an electronicdevice according to an embodiment alternative to that depicted in FIG.3A.

DETAILED DESCRIPTION OF THE INVENTION

FIG. 1A shows a schematic of an electrical-overstress (EOS) protectioncircuit for an electronic device such as that taking the form of anintegrated circuit (IC) 10 according to a first embodiment of thepresent invention. Although a 3.3 volt (V) IC is illustrated, it isappreciated by those skilled in the art that the embodiment may begeneralized to other ICs that operate at a voltage other than 3.3V.

The EOS protection circuit is configured ahead of the IC 10 underprotection in order to prevent the IC 10 from being damaged. In theembodiment, the EOS protection circuit primarily includes resistorsRa-Rc connected in series, a bias circuit 12, and a mode-control switchSm. Specifically, the series-connected resistors Ra-Rc are electricallycoupled between the input Yin of the EOS protection circuit and theoutput Vout of the EOS protection circuit. Electrical coupling of thebias circuit 12 to the input Vin generates a mode-control signal Vm tocontrol the mode-control switch Sm, which is electrically coupledbetween the output Vout and the ground (or Vss). In one exemplaryembodiment, the bias circuit 12 includes a voltage divider thatpartitions the input voltage Vin among a plurality of components (e.g.,series-connected resistors R1-R3 as shown in the figure) of the voltagedivider. The mode-control signal Vm is provided, for example, from thenode between the resistor R2 and the resistor R3.

In a normal mode, for example, when the input Yin of the EOS circuit isabout 1.8V, the bias circuit 12 accordingly generates a low mode-controlsignal Vm to open the mode-control switch Sm. A feature of the inventioncan comprise the mode-control signal Vm being present in a way such thatthe mode-control switch is open in the normal mode. In the exemplaryembodiment, the mode-control signal Vm may be a low voltage of about0.6V in the normal mode. Due to high input impedance of the IC 10, thevoltage drop across the series-connected resistors Ra-Rc is negligiblysmall.

In an EOS mode, for example, when the input Vin of the EOS circuit isabout 10V, the bias circuit 12 accordingly generates a high mode-controlsignal Vm to close the mode-control switch Sm. A feature of theinvention can comprise the mode-control signal Vm being present in a waysuch that the mode-control switch is closed in the EOS mode. In theexemplary embodiment, the mode-control signal Vm may be a high voltageof about 3.3V in the EOS mode. As a result, the output Vout is pulled tolow potential. At the same time, a substantial portion of the EOSvoltage may be approximately partitioned among the series-connectedresistors Ra-Rc, such that the voltage drop across each resistor Ra, Rhor Rc may be below 3.3V to ensure that each resistor Ra, Rb or Rc is notpushed to failure or even damage. Generally speaking, the arrangementand/or number of the series-connected resistors is selected in a waysuch that the voltage drop across each resistor may be below a specifiedoperating voltage (e.g., 3.3V in this example) in the EOS mode to ensurethat each resistor does not undergo failure or damage. One or more ofthe resistors may be implemented with a resistor-configured. MOStransistor.

FIG. 1B shows a schematic of an EOS protection circuit for an IC 10according to an embodiment alternative to that shown in FIG. 1A. Thepresent embodiment is similar in structure and operation to the previousembodiment of FIG. 1A with the exception of the bias circuit 12 furtherincluding a second mode-control switch Sm2. One end of the secondmode-control switch Sm2 is coupled to the node between the resistor R2and the resistor R3, with the other end providing the mode-controlsignal Vm and connection with a weak current source I. Specificallyspeaking, in the normal mode, the second mode-control switch Sm2 isopen, with the mode-control signal Vm being pulled to low potential viathe current source I to ensure that the mode-control switch Sm may beopen. In other words, the second mode-control switch Sm2 may be utilizedto prevent the mode-control switch Sm from being mistakenly closed inthe normal mode.

FIG. 2A and FIG. 2B show one exemplary implementation and associatedparameters of FIG. 1B in the normal mode and the EOS mode respectively.Specifically, each of the series-connected resistors R1-R3 isimplemented with a resistor-configured p-type metal-oxide-semiconductor(PMOS) transistor. For example, the resistor-configured PMOS transistorcan be formed by shorting its gate and drain. The mode-control switch Smis implemented with an n-type MOS (NMOS) transistor, the secondmode-control switch Sm2 is implemented with a PMOS transistor, and thecurrent source I is implemented with a resistor.

It is shown in FIG. 2A that, in the normal mode, the second mode-controlswitch Sm2 is shut off, and the gate of the mode-control switch Sm ispulled low, thereby shutting off the mode-control switch Sm. It is shownin FIG. 2B that, in the EOS mode, the second mode-control switch. Sm2 isturned on, and the gate of the mode-control switch Sm receives a highvoltage e.g., 3.1V), thereby turning on the mode-control switch. Sm.

FIG. 3A shows a schematic of an EOS protection circuit for an IC 10according to a second embodiment of the present invention. The presentembodiment is similar in structure and operation to the embodiment ofFIG. 1A except for the series-connected resistors Ra-Rc being replacedby series-connected voltage-controlled resistors VRa-VRc, such that theresistance becomes low in the normal mode and high in the EOS mode. Theresistance of the voltage-controlled resistors VRa-VRc may berespectively controlled by control signals Vc1-Vc3 provided by the biascircuit 12. In an exemplary embodiment, the voltage-controlled resistorVRa is controlled under the control signal Vc1 that is provided from thenode between the resistor R1 and the resistor R2; the voltage-controlledresistor VRb is controlled under the control signal Vc2 that is providedfrom the node between the resistor R2 and the resistor R3; and thevoltage-controlled resistor VRc controlled under the control signal Vc3that is provided from the node between the resistor R3 and the ground.It is noted that, in the exemplary embodiment, the control signal. Vc2is the same as the mode-control signal Vm.

FIG. 3B shows a schematic of an EOS protection circuit for an IC 10according to an embodiment alternative to that depicted in FIG. 3A. Thepresent embodiment is similar in structure and operation to theembodiment of FIG. 3A with the exception of the bias circuit 12 furtherincluding a second mode-control switch Sm2 and a weak current source Iconfigured similarly to the FIG. 1B arrangement. Furthermore, the biascircuit 12 includes a third mode-control switch (also called an extramode-control switch) Sm3 with one end coupled to the node between theresistor R1 and the resistor R2 and the other end connected with a weakcurrent source I.

In operation, the second mode-control switch Sm2 is open in the normalmode thereby pulling the control signal Vc2 to low level via the currentsource I and accordingly decreasing the resistance of thevoltage-controlled resistor VRb, and the second mode-control switch Sm2is closed in the EOS mode thereby pulling the control signal Vc2 to highlevel and accordingly increasing the resistance of thevoltage-controlled resistor VRb. Similarly, the third mode-controlswitch Sm3 is open in the normal mode thereby pulling the control signalVc1 to low level via the current source I and accordingly decreasing theresistance of the voltage-controlled resistor VRa, and the thirdmode-control switch. Sm3 is closed, in the EOS mode thereby pulling thecontrol signal Vc1 to high level and accordingly increasing theresistance of the voltage-controlled resistor VRa.

Although specific embodiments have been illustrated and described, itwill be appreciated by those skilled in the art that variousmodifications may be made without departing from the scope of thepresent invention, which is intended to be limited solely by theappended claims.

1. An electrical-overstress (EOS) protection circuit for an electronicdevice, comprising: series-connected resistors electrically coupledbetween an input and an output; a mode-control switch electricallycoupled between the output and a ground; and a bias circuit electricallycoupled to the input with a configuration for generation of amode-control signal to control the mode-control switch; wherein themode-control signal is present with the mode-control switch being openin a normal mode and closed in an EOS mode.
 2. The EOS protectioncircuit of claim 1, wherein the series-connected resistors are arrangedand numbered in a way such that voltage drop across each said resistorin the EOS mode is below a specified operating voltage.
 3. The EOSprotection circuit of claim 1, wherein each of the series-connectedresistors is a resistor-configured metal-oxide-semiconductor (MOS)transistor.
 4. The EOS protection circuit of claim 1, wherein the biascircuit comprises a voltage divider configured to partition the inputvoltage among a plurality of components, and wherein the mode-controlsignal is derived from a node among the components.
 5. The EOSprotection circuit of claim 4, wherein each component is a resistorcomponent.
 6. The EOS protection circuit of claim 5, wherein eachresistor component is a resistor-configured. MOS transistor.
 7. The EOSprotection circuit of claim 1, further comprising a second mode-controlswitch with one end coupled to the bias circuit and another endproviding the mode-control signal and being connected with a currentsource, and wherein the second mode-control switch is open in the normalmode and closed in the EOS mode.
 8. The EOS protection circuit of claim1, wherein the bias circuit is arranged to generate the mode-controlsignal in a way such that the mode-control switch is open in the normalmode and is closed, in the EOS mode.